A modified electron multiplier X-ray detector for synchrotron and laser plasma sources

C J Buckley; G Dermody; N Khaleque; A G Michette; S J Pfauntsch; Z Wang; I C E Turku; W Shaik; R Allott

doi:10.1063/1.1291180

A modified electron multiplier X-ray detector for synchrotron and laser plasma sources

C J Buckley, G Dermody, N Khaleque, A G Michette, S J Pfauntsch, Z Wang, I C E Turku, W Shaik, R Allott

Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

Abstract

A 129EM electron multiplier has been modified to detect soft x-rays by coating the first dynode with CsI. The prototype detector was tested at the X1a beamline of the NSLS synchrotron source at Brookhaven Lab and at the laser plasma source at the Rutherford Lab. Initial tests have shown that the detector type is suitable for use in soft x-ray microscopy.

Original language	English
Title of host publication	X-Ray Microscopy
Subtitle of host publication	Proceedings of the Sixth International Conference Berkeley, CA, 2-6 August 1999
Place of Publication	MELVILLE
Publisher	Amer Inst Physics
Pages	405 - 410
Number of pages	6
Volume	507
ISBN (Print)	1-56396-926-2
DOIs	https://doi.org/10.1063/1.1291180
Publication status	Published - 2000
Event	6th International Conference on X-Ray Microscopy - BERKELEY, CALIFORNIA Duration: 1 Jan 2000 → …

Publication series

Name	AIP CONFERENCE PROCEEDINGS

Conference

Conference	6th International Conference on X-Ray Microscopy
City	BERKELEY, CALIFORNIA
Period	1/01/2000 → …

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10.1063/1.1291180

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Buckley, C. J., Dermody, G., Khaleque, N., Michette, A. G., Pfauntsch, S. J., Wang, Z., Turku, I. C. E., Shaik, W., & Allott, R. (2000). A modified electron multiplier X-ray detector for synchrotron and laser plasma sources. In X-Ray Microscopy: Proceedings of the Sixth International Conference Berkeley, CA, 2-6 August 1999 (Vol. 507, pp. 405 - 410). (AIP CONFERENCE PROCEEDINGS). Amer Inst Physics. https://doi.org/10.1063/1.1291180

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title = "A modified electron multiplier X-ray detector for synchrotron and laser plasma sources",

abstract = "A 129EM electron multiplier has been modified to detect soft x-rays by coating the first dynode with CsI. The prototype detector was tested at the X1a beamline of the NSLS synchrotron source at Brookhaven Lab and at the laser plasma source at the Rutherford Lab. Initial tests have shown that the detector type is suitable for use in soft x-ray microscopy.",

author = "Buckley, {C J} and G Dermody and N Khaleque and Michette, {A G} and Pfauntsch, {S J} and Z Wang and Turku, {I C E} and W Shaik and R Allott",

year = "2000",

doi = "10.1063/1.1291180",

language = "English",

isbn = "1-56396-926-2",

volume = "507",

series = "AIP CONFERENCE PROCEEDINGS",

publisher = "Amer Inst Physics",

pages = "405 -- 410",

booktitle = "X-Ray Microscopy",

note = "6th International Conference on X-Ray Microscopy ; Conference date: 01-01-2000",

}

Buckley, CJ, Dermody, G, Khaleque, N, Michette, AG, Pfauntsch, SJ, Wang, Z, Turku, ICE, Shaik, W & Allott, R 2000, A modified electron multiplier X-ray detector for synchrotron and laser plasma sources. in X-Ray Microscopy: Proceedings of the Sixth International Conference Berkeley, CA, 2-6 August 1999. vol. 507, AIP CONFERENCE PROCEEDINGS, Amer Inst Physics, MELVILLE, pp. 405 - 410, 6th International Conference on X-Ray Microscopy, BERKELEY, CALIFORNIA, 1/01/2000. https://doi.org/10.1063/1.1291180

A modified electron multiplier X-ray detector for synchrotron and laser plasma sources. / Buckley, C J; Dermody, G; Khaleque, N et al.
X-Ray Microscopy: Proceedings of the Sixth International Conference Berkeley, CA, 2-6 August 1999. Vol. 507 MELVILLE: Amer Inst Physics, 2000. p. 405 - 410 (AIP CONFERENCE PROCEEDINGS).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

TY - CHAP

T1 - A modified electron multiplier X-ray detector for synchrotron and laser plasma sources

AU - Buckley, C J

AU - Dermody, G

AU - Khaleque, N

AU - Michette, A G

AU - Pfauntsch, S J

AU - Wang, Z

AU - Turku, I C E

AU - Shaik, W

AU - Allott, R

PY - 2000

Y1 - 2000

N2 - A 129EM electron multiplier has been modified to detect soft x-rays by coating the first dynode with CsI. The prototype detector was tested at the X1a beamline of the NSLS synchrotron source at Brookhaven Lab and at the laser plasma source at the Rutherford Lab. Initial tests have shown that the detector type is suitable for use in soft x-ray microscopy.

AB - A 129EM electron multiplier has been modified to detect soft x-rays by coating the first dynode with CsI. The prototype detector was tested at the X1a beamline of the NSLS synchrotron source at Brookhaven Lab and at the laser plasma source at the Rutherford Lab. Initial tests have shown that the detector type is suitable for use in soft x-ray microscopy.

U2 - 10.1063/1.1291180

DO - 10.1063/1.1291180

M3 - Conference paper

SN - 1-56396-926-2

VL - 507

T3 - AIP CONFERENCE PROCEEDINGS

SP - 405

EP - 410

BT - X-Ray Microscopy

PB - Amer Inst Physics

CY - MELVILLE

T2 - 6th International Conference on X-Ray Microscopy

Y2 - 1 January 2000

ER -

Buckley CJ, Dermody G, Khaleque N, Michette AG, Pfauntsch SJ, Wang Z et al. A modified electron multiplier X-ray detector for synchrotron and laser plasma sources. In X-Ray Microscopy: Proceedings of the Sixth International Conference Berkeley, CA, 2-6 August 1999. Vol. 507. MELVILLE: Amer Inst Physics. 2000. p. 405 - 410. (AIP CONFERENCE PROCEEDINGS). doi: 10.1063/1.1291180

A modified electron multiplier X-ray detector for synchrotron and laser plasma sources

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