Configured detector system for STXM imaging

W J Eaton, G R Morrison, N R Waltham

Research output: Chapter in Book/Report/Conference proceedingConference paper

Abstract

A configured detector system based on an 80x80 element x-ray sensitive CCD array has been developed to replace the conventional transmitted x-ray detector used in the scanning transmission x-ray microscope. This from of detector allows a flexible choice of imaging modes to be made simultaneously from only a single scan of the sample. Details of the theoretical benefits expected, and the hardware implementation, are described.
Original languageEnglish
Title of host publicationAIP CONF PROC Vol. 507
Place of PublicationMELVILLE
PublisherAmer Inst Physics
Pages452 - 457
Number of pages6
ISBN (Print)1-56396-926-2
Publication statusPublished - 2000
Event6th International Conference on X-Ray Microscopy - BERKELEY, CALIFORNIA
Duration: 1 Jan 2000 → …

Publication series

NameAIP CONFERENCE PROCEEDINGS

Conference

Conference6th International Conference on X-Ray Microscopy
CityBERKELEY, CALIFORNIA
Period1/01/2000 → …

Fingerprint

Dive into the research topics of 'Configured detector system for STXM imaging'. Together they form a unique fingerprint.

Cite this