Abstract
This paper investigates the benefit of active mechanical Q-control for electrical surface potential measurements in atomic force microscopy. The effective quality-factor of the electrically stimulated cantilever oscillation is additionally increased mechanically at the same frequency with an active analog Q-controller, while in lift-mode. It is shown experimentally that the cantilever oscillation amplitude and therefore the measurement sensitivity is improved by a factor of 15. By spectral noise analysis around the resonance frequency of the cantilever, an increase of the signal-to-noise ratio from 2.5dB to 23dB is achieved.
Original language | English |
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Pages (from-to) | 307-312 |
Number of pages | 6 |
Journal | IFAC-PapersOnLine |
Volume | 52 |
Issue number | 15 |
DOIs | |
Publication status | Published - 1 Sept 2019 |
Event | 8th IFAC Symposium on Mechatronic Systems, MECHATRONICS 2019 - Vienna, Austria Duration: 4 Sept 2019 → 6 Sept 2019 |
Keywords
- AFM
- Electric measurement modes
- Q-control
- SNR