Multiscale modeling of defects in semiconductors: A novel molecular-dynamics scheme

G Csanyi, G Moras, J R Kermode, M C Payne, A Mainwood, A De Vita

Research output: Contribution to journalLiterature reviewpeer-review

Abstract

Now that the modeling of simple semiconductor systems has become reliable, accurate and routine, attention is focusing on larger scale, more complex simulations. Many of these necessarily involve multiscale aspects and can only be tackled by addressing the different length scales simultaneously. We discuss some of the types of problems that require multiscale approaches. Finally we describe the LOTF (learn-on-the-fly) hybrid scheme with a series of examples to show its versatility and power
Original languageEnglish
Pages (from-to)193 - 212
Number of pages20
JournalTOPICS IN APPLIED PHYSICS
Volume104
Publication statusPublished - 2007

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