The NanoBeamBalance: A passive, tensile-test device for the atomic force microscope

M. P. E. Wenger, P. Mesquida

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    4 Citations (Scopus)

    Abstract

    An add-on device is presented, which significantly expands the force measurement capabilities of the atomic force microscope (AFM). The device consists of a completely passive mechanism, which translates the vertical motion of the AFM tip in force measurements into a horizontal motion of two sample support pads. The advantage is that it is much easier to deposit microscopic samples from suspension onto flat surfaces than to attach them reliably between tip and a surface. The working-principle and the design of the device is comprehensively described and demonstrated on the example of collagen fibres with a diameter of a few mu m. Well-defined tensile measurements in longitudinal direction were performed, showing that the tensile stiffness of collagen fibres from rat tail tendon decreases by a factor of 5 when rehydrated from a dried sample and slowly increases upon cross-linking with glutaraldehyde. (C) 2011 American Institute of Physics.
    Original languageEnglish
    Article number053908
    JournalREVIEW OF SCIENTIFIC INSTRUMENTS
    Volume82
    Issue number5
    DOIs
    Publication statusPublished - May 2011

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